Fully automatic wafer probe station

Suitable for 4-12 inch wafer testing, it can provide different testing environment configurations such as high and low temperature, high voltage, and low leakage The device is simple to use, with

CP300 semi-automatic alignment probe station

Automatic alignment test on wafer, simple and fast operation, high resolution and MAP display function.

CRX-SM Low temperature superconducting vacuum probe station

Temperature range 8K-300K; IV/CV/Microwave/Optoelectronic Experimental Testing/Superconducting Vertical Magnetic Field Measurement/Low Temperature Testing

CRX-Closed cycle low-temperature probe station

Temperature range 4.5K-350K; IV/CV/Microwave/Optoelectronic Experimental Testing/Superconducting Vertical Magnetic Field Measurement/Low Temperature Testing

CM-4 mini probe station

Mini size, modular design, for I-V/C-V, PIV test, optoelectronic test, up to 6 inch wafer, applicable to glove box

CS-4 small probe station

Small size, modular design, light weight, up to 6 inch wafer, for I-V/C-V, PIV, optoelectronic tests, applicable to glove box

CL-6 middle-sized probe station

Modular design, precise screw drive structure, up to 8 inch wafer, upgradable for RF test, high current test and laser repair applications.

CH-8-D

CINDBEST CH-8-D 双面点针探针台可用于晶圆和PCB板测试，用于需要正面和背面同时扎针，以实现各种光/电性能测试需求的测试设备。该定制探针台具有优良的机械系统，稳定的结构，符合人体工程学，以及多项升级功能。可广泛应用于集成电路、Wafer ， LED、LCD、太阳能电池等行业的制造和研究领域。

CH-8 large-sized comprehensive probe station

Modular design, seamless upgrade, up to 12 inch wafer. Quick and fine-tuning lift function for chuck stage. Capable for Wafer test, PCB/IC test, RF test, high voltage and current tes

CH-12 large-sized comprehensive probe station

Modular design, seamless upgrade, up to 12 inch wafer, high precise screw drive structure, linear movement, quick and fine-tuning lift function for chuck stage, capable for Wafer test, PCB/IC test,