Fully automatic wafer probe station

Suitable for 4-12 inch wafer testing, it can provide different testing environment configurations such as high and low temperature, high voltage, and low leakage The device is simple to use, with

CP300 semi-automatic alignment probe station

Automatic alignment test on wafer, simple and fast operation, high resolution and MAP display function.

CP200 semi-automatic alignment probe station

Automatic alignment test on wafer, simple and fast operation, high resolution and MAP display function.