Probe Station
Fully automatic wafer probe station

Suitable for 4-12 inch wafer testing, it can provide different testing environment configurations such as high and low temperature, high voltage, and low leakage
The device is simple to use, with stable performance, high efficiency, low vibration, and low noise

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Fully automatic wafer probe station


8英寸半自动探针台



    The highest accuracy can reach ± 1 micrometer, using a fully closed-loop operation control system to achieve high-precision, high-efficiency, and robust positioning motion
The minimum IndexTime can reach 240 milliseconds, with a large base and high rigidity structure, achieving high load, low vibration, and fast tuning motion
The maximum lifting force is 750kgf, and the Z-axis four bar integrated support achieves the minimum deformation under high load or unbalanced load conditions
Testing temperature range -40 ° C to 200 ° C, independently developing various CHUCKs to solve core process problems and achieve precise temperature control



FUNCTION

Wafer Alignment Function
Wafer ID OCR function
Compatible with up to 2 million dies
Adjustment and retesting, compatible with mainstream foreign models in both directions
Quickly generate a map from guided files
Repeat Touch function
Needle Alignment Function
PMI needle mark detection function
GPIB communication
Holding SECS/GEM communication protocol
Offline editing of Map and Die attributes
Fully compatible with the Map file format of mainstream foreign models






规格参数:






C300 H300 T300 M300
适用场合 通用机型 通用机型 适用于三温 适用于存储
适用晶圆尺寸 12寸/8寸
适用晶圆厚度* 200~2200μm 200~2200μm 200~2200μm 200~2200μm
综合精度 XY轴:±1μm
ZF轴:±2μm
XY轴:±1μm
ZF轴:±2μm
XY轴:±1μm
ZF轴:±2μm
XY轴:±1μm
ZF轴:±2μm
Index time 240ms
(X/Y:10mm,Z:0.5mm)
240ms
(X/Y:10mm,Z:0.5mm)
240ms
(X/Y:10mm,Z:0.5mm)
240ms
(X/Y:10mm,Z:0.5mm)
针测压力 250kgf 250kgf 250kgf 750kgf
测试温度* 常温 常温~150℃ -55~200℃ 常温~150℃
测试机对接方式* Cable,Hard Docking,Direct
Docking
Cable,Hard Docking,Direct
Docking
Cable,Hard Docking,Direct
Docking
Hinge,Auto-leveling
通讯接口 GPIB,RS232 GPIB,RS232 GPIB,RS232 GPIB,RS232
设备尺寸 1680mm(W)*1890mm(D)*14
90mm(H)
1680mm(W)*1890mm(D)*14
90mm(H)
1680mm(W)*2080mm(D)*14
90mm(H)
2000mm(W)*1890mm(D)*14
90mm(H)
设备重量 2000kg 2000kg 2000kg 2200kg
电力要求 220VAC1.0KVA 220VAC 2.0KVA 220VAC5.7KVA 220VAC 2.0KVA
压缩空气气压 ≥0.6MPa ≥0.6MPa ≥0.6MPa ≥0.6MPa
真空气压 ≤-60kPa ≤-60kPa ≤-60kPa ≤-60kPa





※支持伯努利手指,满足薄片要求      ※支持温度定制-60℃      ※支持自动换卡 (APC) ※支持加装FFU, 满足高洁净度要求
C200 H200 T200 T200HV
适用场合 通用机型 通用机型 适用于三温 适用于三代半
适用晶圆尺寸 8寸/6寸/5寸/4寸
适用晶圆厚度* 200~2200μm 200~2200μm 200~2200μm 200~2200μm
综合精度 XY轴:±2μm
ZF轴:±2μm
XY轴:±2μm
ZF轴:±2μm
XY轴:±2μm
ZF轴:±2μm
XY轴:±2μm
ZF轴:±2μm
Index time
250ms
(X/Y:10mm,Z:0.5mm)

250ms
(X/Y:10mm,Z:0.5mm)
250ms
(X/Y:10mm,Z:0.5mm)

250ms
(X/Y:10mm,Z:0.5mm)
针测压力 150kgf 150kgf 150kgf 150kgf
测试温度* 常温 常温~150℃ -55~150℃ -40~150℃
测试机对接方式 Cable,Hard Docking Cable,Hard Docking Cable,Hard Docking Cable,Hard Docking
通讯接口 GPIB,RS232 GPIB,RS232 GPIB,RS232 GPIB,RS232
设备尺寸 1300mm(W)*1542mm(D)*96
0mm(H)

1300mm(W)*1542mm(D)*96
0mm(H)
1300mm(W)*1740mm(D)*96
0mm(H)
1300mm(W)*1740mm(D)*96
0mm(H)
设备重量 1200kg 1200kg 1200kg 1200kg
电力要求 220VAC1.0KVA 220VAC 2.0KVA 220VAC5.7KVA 220VAC5.7KVA
压缩空气气压 ≥0.6Mpa ≥0.6Mpa ≥0.6Mpa ≥0.6Mpa
真空气压 ≤-60kPa ≤-60kPa ≤-60kPa ≤-60kPa
※支持伯努利手指,满足薄片要求 ※支持温度定制-60℃ ※支持加装FFU, 满足高洁净度要求








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