CT-6 non-vacuum high and low temperature probe station

Sealed chamber, optimized design with low liquid nitrogen consumption. No frost, high precise screw drive structure, linear movement.

CGO-Variable temperature vacuum probe station

High vacuum chamber, 77K-673K(liquid nitrogen)/4.5K-673K(liquid helium) temperature range, Compatible with IV/CV/RF test, radiation isolating design.

CP200 semi-automatic alignment probe station

Automatic alignment test on wafer, simple and fast operation, high resolution and MAP display function.

±1μm micropositioner

±1μm resolution, Swiss made precise screw, effective and precise for I-V/C-V /RF submicron probing test, highly rigid structure, spring loaded X-Y-Z, stable and backlash free

100fA leakage accurent triaxial probe holder

Triaxial/spring tube, leakage current up to 100fA, recommended to use with CB-40-T or higher precision micropositoners.

Kelvin / pulse probe

specification: Resolution: less than 10fA Probe pitch: from 12 to 100 μm can be customized according to requirements Very low parasitic capacitance

Electron microscope probe

PT-14-6705-B electron microscope probe

Optical fiber cold light source

Piezo motor, nano-scale stage

Triaxial (mother) to Coaxial (mother)