Low temperature ceramic probe

• Standard ceramic probe • Probe tip angle 120 ° • Used for high and low temperature testing

EasyZoom Super Depth Digital Microscope

Thanks to its independently developed advanced optical system, the Motic EasyZoom series ultra depth digital microscope can easily capture high-quality images Quantitative image. Powerful multifunct

Fully automatic wafer probe station

Suitable for 4-12 inch wafer testing, it can provide different testing environment configurations such as high and low temperature, high voltage, and low leakage The device is simple to use, with

CP300 semi-automatic alignment probe station

Automatic alignment test on wafer, simple and fast operation, high resolution and MAP display function.

CRX-SM Low temperature superconducting vacuum probe station

Temperature range 8K-300K; IV/CV/Microwave/Optoelectronic Experimental Testing/Superconducting Vertical Magnetic Field Measurement/Low Temperature Testing

CRX-Closed cycle low-temperature probe station

Temperature range 4.5K-350K; IV/CV/Microwave/Optoelectronic Experimental Testing/Superconducting Vertical Magnetic Field Measurement/Low Temperature Testing

CM-4 mini probe station

Mini size, modular design, for I-V/C-V, PIV test, optoelectronic test, up to 6 inch wafer, applicable to glove box

CS-4 small probe station

Small size, modular design, light weight, up to 6 inch wafer, for I-V/C-V, PIV, optoelectronic tests, applicable to glove box

CL-6 middle-sized probe station

Modular design, precise screw drive structure, up to 8 inch wafer, upgradable for RF test, high current test and laser repair applications.

CH-8-D

CINDBEST CH-8-D 双面点针探针台可用于晶圆和PCB板测试，用于需要正面和背面同时扎针，以实现各种光/电性能测试需求的测试设备。该定制探针台具有优良的机械系统，稳定的结构，符合人体工程学，以及多项升级功能。可广泛应用于集成电路、Wafer ， LED、LCD、太阳能电池等行业的制造和研究领域。