CH-8 large-sized comprehensive probe station

Modular design, seamless upgrade, up to 12 inch wafer. Quick and fine-tuning lift function for chuck stage. Capable for Wafer test, PCB/IC test, RF test, high voltage and current tes

CH-12 large-sized comprehensive probe station

Modular design, seamless upgrade, up to 12 inch wafer, high precise screw drive structure, linear movement, quick and fine-tuning lift function for chuck stage, capable for Wafer test, PCB/IC test,

CT-6 non-vacuum high and low temperature probe station

Sealed chamber, optimized design with low liquid nitrogen consumption. No frost, high precise screw drive structure, linear movement.

CGO-Variable temperature vacuum probe station

High vacuum chamber, 77K-673K(liquid nitrogen)/4.5K-673K(liquid helium) temperature range, Compatible with IV/CV/RF test, radiation isolating design.

CP200 semi-automatic alignment probe station

Automatic alignment test on wafer, simple and fast operation, high resolution and MAP display function.

0.5μm micropositioner

0.5μm resolution, Swiss made precise screw, effective and precise for I-V/C-V /RF submicron probing test, highly rigid structure, spring loaded X-Y-Z, stable and backlash free

0.7μm micropositioner

0.7μm resolution, Swiss made precise screw, effective and precise for I-V/C-V /RF submicron probing test, highly rigid structure, spring loaded X-Y-Z, stable and backlash free

±1μm micropositioner

±1μm resolution, Swiss made precise screw, effective and precise for I-V/C-V /RF submicron probing test, highly rigid structure, spring loaded X-Y-Z, stable and backlash free

10μm micropositioner

10μm resolution, Swiss made precise screw, effective and precise for I-V/C-V /RF submicron probing test, highly rigid structure, spring loaded X-Y-Z, stable and backlash free

RF micropostioner

Applicable RF test, upgraded with CB-100 and CB-200