


		Sealed chamber, optimized design with low liquid nitrogen consumption.
No frost, high precise screw drive structure, linear movement.
	
	
 
CT-6 |6~12" non-vaccum high and low temperature probe station
	
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					 Features / Applications 
						 
 ◆ Up to 12 inches wafer 
						 ◆ Sealed chamber, isolated from external interference 
						 ◆ Optimized design with low liquid nitrogen consumption 
						 ◆ No frost under low temperature 
						 ◆ High precise screw drive structure, linear movement 
						 ◆ Compatible for multiple types of microscope 
						 ◆ Modular design, seamless upgrade 
						 ◆ Non-standard product, can be customized upon request 
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Specifications
	
	
Chuck stage
| 
				 Model  | 
			
				 CT-6/CT-8/CT-12  | 
		
| 
				 Chuck size  | 
			
				 6"/8"/12"  | 
		
| 
				 Rotation angle  | 
			
				 360°with angle locking, fine-tuning for 15° with 0.1μm resolution  | 
		
| 
				 X-Y travel range  | 
			
				 6"*6"/8"*8"/12"*12"  | 
		
| 
				 X-Y travel resolution  | 
			
				 10μm/1μm  | 
		
| 
				 Sample mounting type  | 
			
				 Vacuum  | 
		
| 
				 Chuck capacity  | 
			
				 U shape, up to 12 micropositioners  | 
		
| 
				 Electrical design  | 
			
				 Electrical floating on chuck back, can be used as gate electrode  | 
		
	
Optical system
| 
				 Microscope  | 
			
				 Single tube microscope /stereo microscope /metalloscope  | 
		
| 
				 Magnification  | 
			
				 16X-200X/20X-4000X  | 
		
| 
				 Travel range  | 
			
				 X-Y up to 2"*2", vertical to 50.8mm  | 
		
| 
				 Camera  | 
			
				 CCD Camera  | 
		
| 
				 Illumination  | 
			
				 Coaxial and ring light  | 
		
	
Micropositioner
| 
				 X-Y-Z travel range  | 
			
				 12mm-12mm-12mm  | 
		
| 
				 Resolution  | 
			
				 10um/2um/0.7um/0.5um  | 
		
| 
				 Mounting type  | 
			
				 Magnetic/vacuum  | 
		
| 
				 Cable  | 
			
				 Coaxial/triaxial  | 
		
| 
				 Leakage current  | 
			
				 10pA/100fA/10fA upon request  | 
		
| 
				 Cable adaptor  | 
			
				 Banana head /Crocodile clip /Coaxial /Triaxial  | 
		
| 
				 Probe tip diameter  | 
			
				 0.2um/1um/2um/5um/10um/20um upon request  | 
		
| 
				 Probe metal  | 
			
				 Tungsten/Beryllium copper upon request  | 
		
	
Optional accessories
| 
				 Hot chuck  | 
		
| 
				 Display screen  | 
		
| 
				 Connector  | 
		
| 
				 RF testing accessoriess  | 
		
| 
				 Shielding box  | 
		
| 
				 Vibration free table  | 
		
| 
				 Optical platform  | 
		
| 
				 Gold plated Chuck  | 
		
| 
				 Light intensity / wavelength testing  | 
		
| 
				 High voltage test accessories  | 
		
| 
				 Microscope quick inclining device  | 
		
| 
				 Laser system  | 
		
| 
				 Probe card clamp  | 
		
	
Specifications and designs are subject to change without notice.
	
| 
				Shenzhen Cindbest Technology Co., Ltd | 
			
				 
					Shenzhen Cindbest Technology Co., Ltd 
					Add: 8F Weihuada Industrial Park No.5 Lirong Rd Xinshi Com Dalang St Longhua Dist Shenzhen,China 
					Tel: 0755-29412885 E-mail: aldrich@cindbest.com;  |